Electron Energy Filter for Jeol JEM F-200

The Paul Scherrer Institute will purchase an electron energy filter for a 200 kV (scanning) JEOL JEM-F200 transmission electron microscope. The filter will primarily be used for energy filtered data collection in imaging and diffraction mode, using detectors that have been and are being developed at the PSI. The energy filter has two purposes: (i) to reduce the signal of inelastically scattered electrons; and (ii) to bend the electron beam, allowing significant post-column magnification by inserting a flight tube between the energy filter and a detector. For details, see requirement specification PSI-AA24-001 Rev.1.00.