Maintenance and repair of electron microprobe and microscopes for the examination of highly radioactive samples

JRC Karlsruhe intends to make a call for tender for the maintenance of their equipment used for microstructure investigation. It consists in a set of devices including a shielded electron probe microanalyser (EPMA) a nuclearized Transmission Electron Microscope (TEM), two nuclearized Scanning Electron Microscopes (SEM), a Focused Ion Beam (FIB) as well as two standards SEM. The service will include preventive maintenance of the equipment and repairs as well as provision of spare parts.